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log–normal probability distribution function  (SYSTAT)

 
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    SYSTAT log–normal probability distribution function
    The median values of all adhesion forces ( F mdn ) measured between the AFM tips and nanofilms with respect to different durations of UV light exposure, and the most probable values ( x o ) of the adhesion forces quantified by fitting <t> lognormal </t> dynamic peak function to the adhesion data. A total of 192 retraction force‐distance curves were analyzed for each of the groups investigated. R 2 values represent the quality of the log‐normal fitting. The S a and S q parameters of the nanofilms are also given below.
    Log–Normal Probability Distribution Function, supplied by SYSTAT, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
    https://www.bioz.com/result/log–normal probability distribution function/product/SYSTAT
    Average 90 stars, based on 1 article reviews
    log–normal probability distribution function - by Bioz Stars, 2026-04
    90/100 stars

    Images

    1) Product Images from "Effect of UV Light Exposure Duration on the Removal of Exfoliation Agent Residues in Two‐Dimensional Perovskite Nanosheets: An AFM Study"

    Article Title: Effect of UV Light Exposure Duration on the Removal of Exfoliation Agent Residues in Two‐Dimensional Perovskite Nanosheets: An AFM Study

    Journal: Chempluschem

    doi: 10.1002/cplu.202400678

    The median values of all adhesion forces ( F mdn ) measured between the AFM tips and nanofilms with respect to different durations of UV light exposure, and the most probable values ( x o ) of the adhesion forces quantified by fitting lognormal dynamic peak function to the adhesion data. A total of 192 retraction force‐distance curves were analyzed for each of the groups investigated. R 2 values represent the quality of the log‐normal fitting. The S a and S q parameters of the nanofilms are also given below.
    Figure Legend Snippet: The median values of all adhesion forces ( F mdn ) measured between the AFM tips and nanofilms with respect to different durations of UV light exposure, and the most probable values ( x o ) of the adhesion forces quantified by fitting lognormal dynamic peak function to the adhesion data. A total of 192 retraction force‐distance curves were analyzed for each of the groups investigated. R 2 values represent the quality of the log‐normal fitting. The S a and S q parameters of the nanofilms are also given below.

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    log–normal probability distribution function  (SYSTAT)
    90
    SYSTAT log–normal probability distribution function
    The median values of all adhesion forces ( F mdn ) measured between the AFM tips and nanofilms with respect to different durations of UV light exposure, and the most probable values ( x o ) of the adhesion forces quantified by fitting <t> lognormal </t> dynamic peak function to the adhesion data. A total of 192 retraction force‐distance curves were analyzed for each of the groups investigated. R 2 values represent the quality of the log‐normal fitting. The S a and S q parameters of the nanofilms are also given below.
    Log–Normal Probability Distribution Function, supplied by SYSTAT, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
    https://www.bioz.com/result/log–normal probability distribution function/product/SYSTAT
    Average 90 stars, based on 1 article reviews
    log–normal probability distribution function - by Bioz Stars, 2026-04
    90/100 stars
    		  Buy from Supplier
    log-normal probability distribution function  (SYSTAT)
    90
    SYSTAT log-normal probability distribution function
    The median values of all adhesion forces ( F mdn ) measured between the AFM tips and nanofilms with respect to different durations of UV light exposure, and the most probable values ( x o ) of the adhesion forces quantified by fitting <t> lognormal </t> dynamic peak function to the adhesion data. A total of 192 retraction force‐distance curves were analyzed for each of the groups investigated. R 2 values represent the quality of the log‐normal fitting. The S a and S q parameters of the nanofilms are also given below.
    Log Normal Probability Distribution Function, supplied by SYSTAT, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
    https://www.bioz.com/result/log-normal probability distribution function/product/SYSTAT
    Average 90 stars, based on 1 article reviews
    log-normal probability distribution function - by Bioz Stars, 2026-04
    90/100 stars
    		  Buy from Supplier

    Image Search Results


    The median values of all adhesion forces ( F mdn ) measured between the AFM tips and nanofilms with respect to different durations of UV light exposure, and the most probable values ( x o ) of the adhesion forces quantified by fitting lognormal dynamic peak function to the adhesion data. A total of 192 retraction force‐distance curves were analyzed for each of the groups investigated. R 2 values represent the quality of the log‐normal fitting. The S a and S q parameters of the nanofilms are also given below.

    Journal: Chempluschem

    Article Title: Effect of UV Light Exposure Duration on the Removal of Exfoliation Agent Residues in Two‐Dimensional Perovskite Nanosheets: An AFM Study

    doi: 10.1002/cplu.202400678

    Figure Lengend Snippet: The median values of all adhesion forces ( F mdn ) measured between the AFM tips and nanofilms with respect to different durations of UV light exposure, and the most probable values ( x o ) of the adhesion forces quantified by fitting lognormal dynamic peak function to the adhesion data. A total of 192 retraction force‐distance curves were analyzed for each of the groups investigated. R 2 values represent the quality of the log‐normal fitting. The S a and S q parameters of the nanofilms are also given below.

    Article Snippet: The most probable adhesion force values were determined for each condition by applying a log‐normal probability distribution function to the histograms (SigmaPlot, Systat Software Inc.).

    Techniques: